Bruker Nano Surfaces provides industry-leading surface analysis instruments for both research and production environments. Bruker’s Dektak™ and Contour™ 2D and 3D surface profiler solutions are easy to use and will provide you the critical measurements needed for step heights, roughness, bow, warp, and wafer stress.
In addition, we can also assist you with Bruker Atomic Force Microscopes (AFMs), and tribometers.
Bruker Nano Surfaces Profilometers
Are you a current Bruker Dektak or Contour instrument owner or user?
Please let us know how we may be of assistance regarding service needs, spare parts, retrofits, or upgrades by filling out our support request form.
