Tag: Secondary Ion Mass Spectrometry

What is Surface Interface Analysis?

This is a re-post of an article published by Hiden Analytical of Warrington, England. In materials science, a surface interface refers to the boundary region between air or a vacuum and physical media. The atomic composition and topography of a

SIMS Secondary Ion Mass Spectrometry – Common Applications

The Suib Group at the University of Connecticut collaborated with Hiden Analytical to determine the effectiveness of Hiden’s Compact SIMS (Secondary Ion Mass Spectroscopy) Analysis System for various research applications, including: Surface Contamination on Silver Electrodes Catalyst Dopant Homogeneity Carbon